ATE/Test RF Switches
With UltraCMOS® RFICs on board, throughput is higher, accuracy is better, and test results are reliable. The newest HaRP™-enhanced RF devices from Peregrine Semiconductor, designed specifically for the demanding rigors of T&M/ATE equipment, deliver fast settling time and minimize gate-lag and phase drift, ensuring excellent test performance. Fast settling time means quicker throughput and higher volume. Excellent low-frequency performance results in higher test accuracy. And a standard CMOS-based IC means you can count on quality and reliability.
